Test Development

Our skilled engineers at Vital Systems will evaluate and recommend the most cost effective way of test printed circuit board assemblies. Selecting from the simple test methods to the more comprehensive test solutions dependant on complexity, production volume and other parameters to suit our customer’s needs.

Functional Test
Vital Systems will help develop Full Functional Test capabilities to meet customer needs for testing. Service includes development and production of test bed, interface electronics, software and data gathering, and reporting systems. Full function testing is universally recognized as the final criteria of validation prior to shipping the product. Usually it is the only test necessary.

In Circuit Test (ICT)
Vital Systems offers In Circuit Test where required, and employ the strength of this parametric testing to improve yields in production.

Boundary Scan Test
Boundary Scan or JTAG/IEEE 1149.1 is available at Vital Systems. This test method was developed to address the accessibility issues of BGA in testing. This comprehensive test is geared to detect manufacturing defects down to pin level.

Throughput Platforms
At Vital Systems our focus is on providing cost effective test solutions on the production floor. We offer different test technologies on a production platforms geared for throughput and cost effectiveness.

In System Programming (ISP)
We help develop tailored test platforms that will allow firmware download or in system programming (ISP) for Flash and PLD.

Test Data Capture
Vital Systems can capture and report test data through its data reporting system. Data can be accessed online by customers through this website. Potentially, our customers can review the data and accept/reject the shipment prior to authorizing shipment, all without leaving their office.